5962-9172601MLA
IC SCAN TEST DEVICE 8BIT 24-CDIP
Part Number：
5962-9172601MLA
Manufacturer：
Texas Instruments
Category：
Integrated Circuits (ICs)
> Logic
> Specialty Logic
Description：
IC SCAN TEST DEVICE 8BIT 24-CDIP
RoHS：
YES
5962-9172601MLA Specifications
Mounting Type:
Through Hole
Part Status:
Active
Operating Temperature:
-55°C ~ 125°C
Number of Bits:
8
Supply Voltage:
4.5V ~ 5.5V
Supplier Device Package:
24-CDIP
Grade:
Military
Package / Case:
24-CDIP (0.300", 7.62mm)
Logic Type:
Scan Test Device with Buffers
Qualification:
MIL-PRF-38535L
You May Also Like
V62/04730-01XE
IC ABT SCN TST DEV 9BIT 64TSSOP
$11.82
Order More
M38510/07801BJA
IC ARITH LOGIC UNIT 4BIT 24CDIP
Order More
SNJ54BCT8245AJT
IC SCAN TEST DEVICE 8BIT 24-CDIP
Order More
JM38510/34201BEA
IC BINARY FULL ADDER 4BIT 16CDIP
Order More
JM38510/31202BEA
IC BINARY FULL ADDER 4BIT 16CDIP
Order More
SN54LS283J
IC BINARY FULL ADDER 4BIT 16CDIP
Order More
SNJ54ABT8646FK
IC SCAN TEST DEVICE 8BIT 28-LCCC
Order More
JM38510/34201BFA
IC BINARY FULL ADDER 4BIT 16-CFP
Order More
SNJ54BCT8244AJT
IC SCAN TEST DEVICE 8BIT 24-CDIP
Order More
SNJ54BCT8245AFK
IC SCAN TEST DEVICE 8BIT 28-LCCC
Order More